Product Description
MODEL 1040 NanoMill® TEM Specimen Preparation System
Uses an ultra-low energy, concentrated ion beam to produce the highest quality specimens for transmission electron microscopy (TEM).
MODEL 1040 NanoMill® TEM Specimen Preparation System
Product Description
MODEL 1040 NanoMill® TEM Specimen Preparation System
Uses an ultra-low energy, concentrated ion beam to produce the highest quality specimens for transmission electron microscopy (TEM).